Analytical formulae for calculation of X-ray detector solid angles in the scanning and scanning/transmission analytical electron microscope.
نویسنده
چکیده
Closed form analytical equations used to calculate the collection solid angle of six common geometries of solid-state X-ray detectors in scanning and scanning/transmission analytical electron microscopy are presented. Using these formulae one can make realistic comparisons of the merits of the different detector geometries in modern electron column instruments. This work updates earlier formulations and adds new detector configurations.
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ورودعنوان ژورنال:
- Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
دوره 20 4 شماره
صفحات -
تاریخ انتشار 2014